Bread-and-Butter Case Verification In most test-based environments that use dynamic simulation, the aim is to start throwing ...
Ensuring data gets to where it’s supposed to go at exactly the right time is a growing challenge for design engineers and architects developing heterogeneous systems. There is more data moving around ...
A new technical paper titled “Towards Fine-grained Partitioning of Low-level SRAM Caches for Emerging 3D-IC Designs” was ...
Why the chip industry is so focused on large language models for designing and manufacturing chips, and what problems need to ...
A Compact Behavioral Model for Volatile Memristors” was published by researchers at Technion – Israel Institute of Technology ...
Several critical processes address wafer flatness, wafer edge defects and what's needed to enable bonded wafer stacks.
A new technical paper titled “Impact of Strain on Sub-3 nm Gate-all-Around CMOS Logic Circuit Performance Using a Neural ...
A new technical paper titled “Using both faces of polar semiconductor wafers for functional devices” was published by ...
A new technical paper titled “Towards Efficient Neuro-Symbolic AI: From Workload Characterization to Hardware Architecture” ...
“While experiments have shown devices can retain information for over 10 years, the models used in the community show that ...
Chiplet-based products must accommodate small differences in die size and bump pitch, placing new demands on manufacturing ...
A new technical paper titled “Hardware Acceleration of Kolmogorov-Arnold Network (KAN) for Lightweight Edge Inference” was ...